00846naa a2200169 a 450000100080000000500110000800800410001910000200006024501070008026000090018752002590019665000150045565300170047065300120048770000170049977301600051610290402012-02-13       2001    bl ---       0--  u    #d1 aASSIS, O. B. G.  aComplementary analysis by atomic force microscopy of sol-gel films processed by dip-coating technique.  c2001  aThe morphology and additional surface features of SiO2 films processed via sol-gel were evaluated by atomic force microscopy. Two sintering temperatures, 550 and 650 C were used for densification of gels deposited by dip-coating technique onto Ni plates.  asilica gel  aFilmes Finos  asol-gel1 aALVES, C. R.  tActa Microscopica, Maracaibogv. 10, p. 153-156, apr. 2001. Supplement 1. First Latin American Symposium on Scanning Microscopy, São Pedro, SP, apr. 2001.