01231naa a2200241 a 450000100080000000500110000800800410001910000160006024500430007626000090011952004610012865300350058965300150062465300130063965300160065270000180066870000170068670000130070370000070071670000240072370000220074777302200076910289102005-04-05       2003    bl ---       0--  u    #d1 aFIRMINO, A.  aAFM as a tool for development sensors.  c2003  aAtomic force microscopy (AFM) is a powerful tool for the characterisation of poiymeric fthns [ 1-4], however, only a few studies have being IDade using this technique in sensor applications. In the present work, It has been employed in the development of a taste sensor, siIK:.e the study of the interfacial phenomena at the electrode/electroiyte interface may lead to a better comlX"ehension of the basic transducing processes occurring at the nano-scale.  aMicroscopia de Força Atômica  aPolímeros  aSensores  aSuperfície1 aBORATO, C. E.1 aLEITE, F. L.1 aRIUL JR.1 aA.1 aBERNARDES FILHO, R.1 aMATTOSO, L. H. C.  tActa Microscopica, Maracaibogv. 12, Apr. 2003. Supplement A. CD de trabalhos e resumos apresentados no Second Latin American Symposium on Scanning Probe Microscopy, Búzios, Apr. 2003. 2 f. Invited paper. 1 CD-ROM.