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| Registros recuperados : 17.114 | |
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Registro Completo
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Biblioteca(s): |
Embrapa Cerrados. |
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Data corrente: |
26/12/2013 |
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Data da última atualização: |
26/12/2013 |
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Tipo da produção científica: |
Artigo em Periódico Indexado |
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Circulação/Nível: |
A - 2 |
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Autoria: |
MORAES, S. V. de P.; HUNT, T. E.; WRIGHT, R. J.; HEIN, G. L.; BLANKENSHIP, E. E. |
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Afiliação: |
SILVANA VIEIRA DE PAULA MORAES, CPAC; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN; UNIVERSITY OF NEBRASKA-LINCOLN. |
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Título: |
Western bean cutworm survival and the development of economic injury levels and economic thresholds in field corn. |
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Ano de publicação: |
2013 |
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Fonte/Imprenta: |
Journal of Economic Entomology, College Park, v. 106, n. 3, p. 1274-1285, 2013. |
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DOI: |
http://dx.doi.org/10.1603/EC12436 |
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Idioma: |
Inglês |
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Conteúdo: |
Western bean cutworm, Striacosta albicosta (Smith) (Lepidoptera: Noctuidae), is a native pest of dry beans (Phaseolus vulgaris L.) and corn (Zea mays L.). Historically, the western bean cutworm was distributed in the western United States, but since 1999 eastward expansion has been observed. In corn, economic impact is caused by larval ear feeding. Information on western bean cutworm biology, ecology, and economic impact is relatively limited, and the development of economic injury levels (EILs) and economic thresholds (ETs) is required for more effective management. Studies during 2008Ð2011, across three ecoregions of Nebraska, sought to characterize western bean cutworm survival and development of EILs and ETs. Calculations of EILs and ETs incorporated the dynamics of corn price, management cost, and pest survival. The results from the current study demonstrated low larval survival of this species (1.51Ð12.82%). The mean yield loss from one western bean cutworm larva per plant was 945.52 kg/ha (15.08 bu/acre), based on 74,100 plants per ha. Economic thresholds are expressed as a percentage of plants with at least one egg mass. This study is the Þrst study that explicitly incorporates variable management costs and crop values into western bean cutworm EIL calculations, and larval survival into ET calculations. |
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Palavras-Chave: |
Bean; Nivel de dano ecônomico; Resistência larval; Striacosta albicosta; Western bean cutworm. |
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Thesagro: |
Feijão; Lagarta; Lagarta rosca; Milho; Praga de planta. |
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Thesaurus NAL: |
Biological resistance; Corn; Economic threshold; Larval development; Pests; Richia albicosta; United States. |
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Categoria do assunto: |
O Insetos e Entomologia |
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URL: |
https://ainfo.cnptia.embrapa.br/digital/bitstream/item/94467/1/33774.pdf
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Marc: |
LEADER 02452naa a2200385 a 4500
001 1974639
005 2013-12-26
008 2013 bl uuuu u00u1 u #d
024 7 $ahttp://dx.doi.org/10.1603/EC12436$2DOI
100 1 $aMORAES, S. V. de P.
245 $aWestern bean cutworm survival and the development of economic injury levels and economic thresholds in field corn.
260 $c2013
520 $aWestern bean cutworm, Striacosta albicosta (Smith) (Lepidoptera: Noctuidae), is a native pest of dry beans (Phaseolus vulgaris L.) and corn (Zea mays L.). Historically, the western bean cutworm was distributed in the western United States, but since 1999 eastward expansion has been observed. In corn, economic impact is caused by larval ear feeding. Information on western bean cutworm biology, ecology, and economic impact is relatively limited, and the development of economic injury levels (EILs) and economic thresholds (ETs) is required for more effective management. Studies during 2008Ð2011, across three ecoregions of Nebraska, sought to characterize western bean cutworm survival and development of EILs and ETs. Calculations of EILs and ETs incorporated the dynamics of corn price, management cost, and pest survival. The results from the current study demonstrated low larval survival of this species (1.51Ð12.82%). The mean yield loss from one western bean cutworm larva per plant was 945.52 kg/ha (15.08 bu/acre), based on 74,100 plants per ha. Economic thresholds are expressed as a percentage of plants with at least one egg mass. This study is the Þrst study that explicitly incorporates variable management costs and crop values into western bean cutworm EIL calculations, and larval survival into ET calculations.
650 $aBiological resistance
650 $aCorn
650 $aEconomic threshold
650 $aLarval development
650 $aPests
650 $aRichia albicosta
650 $aUnited States
650 $aFeijão
650 $aLagarta
650 $aLagarta rosca
650 $aMilho
650 $aPraga de planta
653 $aBean
653 $aNivel de dano ecônomico
653 $aResistência larval
653 $aStriacosta albicosta
653 $aWestern bean cutworm
700 1 $aHUNT, T. E.
700 1 $aWRIGHT, R. J.
700 1 $aHEIN, G. L.
700 1 $aBLANKENSHIP, E. E.
773 $tJournal of Economic Entomology, College Park$gv. 106, n. 3, p. 1274-1285, 2013.
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Embrapa Cerrados (CPAC) |
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