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12. | | RAJA, S.; MATTOSO, L. H. C. Surface modification on cellulose nanocrystals (CNC) towards organic redox - batteries. In: WORKSHOP DA REDE DE NANOTECNOLOGIA APLICADA AO AGRONEGÓCIO, 9., 2017, São Carlos. Anais ... São Carlos: Embrapa Instrumentação, 2017. p.609-612. Editores: Caue Ribeiro de Oliveira, Elaine Cristina Paris, Luiz Henrique Capparelli Mattoso, Marcelo Porto Bemquerer, Maria Alice Martins, Odílio Benedito Garrido de Assis. Biblioteca(s): Embrapa Instrumentação. |
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Registros recuperados : 1.552 | |
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| Acesso ao texto completo restrito à biblioteca da Embrapa Instrumentação. Para informações adicionais entre em contato com cnpdia.biblioteca@embrapa.br. |
Registro Completo
Biblioteca(s): |
Embrapa Instrumentação. |
Data corrente: |
23/01/2006 |
Data da última atualização: |
23/01/2006 |
Autoria: |
MATTOSO, L. H. C. |
Título: |
Using atomic force microscopy to investigate nanostructered polymer films. |
Ano de publicação: |
2005 |
Fonte/Imprenta: |
In: LATIN AMERICAM SYMPOSIUM ON SCANNING PROBE MICROSCOPY, 3., 2005, Ouro Preto. [Invited...]. Ouro Preto: SBMN, 2005. 1 CD-ROM. |
Idioma: |
Inglês |
Conteúdo: |
Actually atomic force microscopy (AFM) is a well know microscopy technique, which has been used to obtain the topography image with atomic resolution, in distinct materials, even in aqueous solution. With the interaction between tip and sample is possible to exploit new phenomena and obtain information, in nanoscale that never had been investigated before, as for example: the nanoforces of the capillary forces, adhesion forces, double layer forces, in Z-direction, and in different parts of the sample. |
Palavras-Chave: |
AFM; Nanoforces. |
Thesaurus NAL: |
scanning probe microscopy. |
Categoria do assunto: |
-- |
Marc: |
LEADER 01025naa a2200157 a 4500 001 1029288 005 2006-01-23 008 2005 bl --- 0-- u #d 100 1 $aMATTOSO, L. H. C. 245 $aUsing atomic force microscopy to investigate nanostructered polymer films. 260 $c2005 520 $aActually atomic force microscopy (AFM) is a well know microscopy technique, which has been used to obtain the topography image with atomic resolution, in distinct materials, even in aqueous solution. With the interaction between tip and sample is possible to exploit new phenomena and obtain information, in nanoscale that never had been investigated before, as for example: the nanoforces of the capillary forces, adhesion forces, double layer forces, in Z-direction, and in different parts of the sample. 650 $ascanning probe microscopy 653 $aAFM 653 $aNanoforces 773 $tIn: LATIN AMERICAM SYMPOSIUM ON SCANNING PROBE MICROSCOPY, 3., 2005, Ouro Preto. [Invited...]. Ouro Preto: SBMN, 2005. 1 CD-ROM.
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