Data/hora: 04/06/2024 05:28:56

Biblioteca(s): 	Embrapa Instrumentação.	
Data corrente: 	23/03/2005	
Data da última atualização: 	23/03/2005	
Autoria: 	RIBEIRO, T. P.; CRUVINEL, P. E.; TOMAZELLO FILHO, M.; HERRMANN, P. S. P.	
Título: 	Brazilian wood samples analysis by means of atomic force microscopy.	
Ano de publicação: 	2003	
Fonte/Imprenta: 	Acta Microscopica, suppl. A, v. 10, p. 107-111, 2003.	
Idioma: 	Inglês	
Conteúdo: 	The atomic force microscopy technique (AFM) is a useful tool to study surfaces and has been used to provide qualitative and quantitative inforrnation about nanometer-scale matter properties, that are often inaccessible by any other experimental techniques. In this work the AFM was used to investigate surface properties of cellulose, fibers, and papers ofBrazilian wood samples. Comparative studies were accomplished in the surface morphology, and results have shown a better understanding for wood processing forrnation and constituent architecture. 
	
Palavras-Chave: 	AFM; Cell Wall; Estruturas; Microscopia de Força Atômica; morfologia.	
Categoria do assunto: 	--	
Registro original: 	Embrapa Instrumentação (CNPDIA)	
Exemplares: 	CNPDIA - (8739-1) - UPC - SP - -- - PROCI-03.00084 -  - 2003.00084 - DIS