Data/hora: 04/06/2024 21:37:19

Biblioteca(s): 	Embrapa Instrumentação.	
Data corrente: 	14/02/2006	
Data da última atualização: 	14/02/2006	
Autoria: 	LEITE, F. L.; PATERNO, L. G.; BORATO, C. E.; HERRMANN, P. S. P.; OLIVEIRA JÚNIOR, O. N.; MATTOSO, L. H. C.	
Título: 	Study on the adsorption of poly(o-ethoxyaniline) nanostructured films using atomic force microscopy.	
Ano de publicação: 	0	
Fonte/Imprenta: 	Polymer, v.46, n.26, p. 12503-12510, Dec. 2005. Disponível em www.sciencedirect.com. Acesso em: 06 de fevereiro de 2005.	
Idioma: 	Inglês	
Conteúdo: 	Nanostructured films of poly(o-ethoxyaniline) (POEA) were studied by atomic force microscopy (AFM), which indicated a globular morphology for films containing one or more layers of POEA. Conistent with the nucleation and growth model for the adsorption process, the mean roughness and fractal dimension were found to increase with the time of adsorption and with the number of POEA layers in the initial stages of adsorption, reached maximum values and then decreased after 10 min of adsorption or after deposition of five POEA layers. Such behavior has been explained in terms of the decrease in the film irregularities, with voids being filled with polymeric material leading to smoother surfaces.	
Palavras-Chave: 	AFM; POEA; Poly(o-ethoxyaniline).	
Categoria do assunto: 	--	
Registro original: 	Embrapa Instrumentação (CNPDIA)	
Exemplares: 	CNPDIA - (9407-1) - UPC - SP - -- - PROCI-05.00135 -  - 2005.00135 - DIS