Consulta: (autoria:"VUICHARD, N.")
Registros recuperados: 1
Data/hora: 23/06/2024 04:18:04

VALADE, A.; CIAIS, P.; VUICHARD, N.; VIOVY, N.; CAUBEL, A.; HUTH, N.; MARIN, F. R.; MARTINÉ, J.-F. Modeling sugar cane yield with a process-based model from site to continental scale: uncertainties arising from model structure and parameter values. Geoscientific Model Development, Gottingen, v. 7, p. 1225-1245, 2014.
URL: https://ainfo.cnptia.embrapa.br/digital/bitstream/item/107792/1/gmd-7-1225-2014.pdf
Biblioteca(s): Embrapa Agricultura Digital.