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WANG, L.-T.; STROUD, C. E.; TOUBA, N. A. System-on-chip test architectures: nanometer design for testability Amsterdam; Boston: Morgan Kaufmann Publishers, c2008. xxxvi, 856 p. : ill. ;25 cm. The Morgan Kaufmann series in systems on silicon
URL: https://www.sciencedirect.com/science/book/9780123739735
Biblioteca(s): Ebooks.