Data/hora: 16/06/2024 17:29:24

Biblioteca(s): 	Embrapa Instrumentação.	
Data corrente: 	25/04/2003	
Data da última atualização: 	22/07/2010	
Autoria: 	MATTOSO, L. H. C.; RIUL JR. A.; HERRMANN, P. S. P.; BERNARDES FILHO, R.	
Afiliação: 	Embrapa Instrumentação Agropecuária, São Carlos, SP.	
Título: 	Use of atomic force microscopy for the study of polymers.	
Ano de publicação: 	2003	
Fonte/Imprenta: 	Acta Microscopica, Maracaibo, v.12, 2003. Supplement A	
Idioma: 	Inglês	
Notas: 	CD de trabalhos e resumos apresentados no Second Latin American Symposium on Scanning Microscopy, Búzios, Apr. 2003. 1 f.  1 CD-ROM.	
Conteúdo: 	Atomic force microscopy (AFM) and other scanning probe microscopy (SPM) techniques  are receiving a great attention in the last years due to their enormous potential of investigation of materials at the nanoscale. They posses several advantages over the common electon microscopy techniques for the study of materials such as greater resolution, surface properties such as stiffness, hardness, adhesion, etc, can be evaluated, measurements can be taken inside solutions, assessment of chemical interactions between samples and tips modified with different chemical species, etc. For instance, atomic force microscopy can be successfully used to study the morphology, quantify the roughness and chek microscopically several other surface properties. The aim of this presentation is to provide some insight on the use of AFM technique as a tool for the study of conducting polymers blends, self-assembled and nanostructured thin films for sensor applications and natural fibers and their modification by benzylation and plasma tretment. The morphology and roughness of these materials can be significantly modified as a function of the surface tratment used, as shown by AFM, which presented to be a prowerful tool for studying different types of polymers.	
Palavras-Chave: 	Microscopia de força atômica; Polímero; Técnicas de microscopia.	
Thesaurus Nal: 	atomic force microscopy.	
Categoria do assunto: 	--	
Registro original: 	Embrapa Instrumentação (CNPDIA)	
Exemplares: 	CNPDIA - (7445-1) - UPC - AP - -- - PROCI-03.00008 - MAT - 2003.00008 - DIS