Data/hora: 16/06/2024 18:00:10

Biblioteca(s): | Embrapa Instrumentação.
Data corrente: | 23/01/2006
Data da última atualização: | 23/01/2006
Autoria: | MATTOSO, L. H. C.
Título: | Using atomic force microscopy to investigate nanostructered polymer films.
Ano de publicação: | 2005
Fonte/Imprenta: | In: LATIN AMERICAM SYMPOSIUM ON SCANNING PROBE MICROSCOPY, 3., 2005, Ouro Preto. [Invited...]. Ouro Preto: SBMN, 2005. 1 CD-ROM.
Idioma: | Inglês
Conteúdo: | Actually atomic force microscopy (AFM) is a well know microscopy technique, which has been used to obtain the topography image with atomic resolution, in distinct materials, even in aqueous solution. With the interaction between tip and sample is possible to exploit new phenomena and obtain information, in nanoscale that never had been investigated before, as for example: the nanoforces of the capillary forces, adhesion forces, double layer forces, in Z-direction, and in different parts of the sample.
Palavras-Chave: | AFM; Nanoforces.
Thesaurus Nal: | scanning probe microscopy.
Categoria do assunto: | --
Registro original: | Embrapa Instrumentação (CNPDIA)
Exemplares: | CNPDIA - (9223-1) - UPC - SP - -- - PROCI-05.00066 -  - 2005.00066 - DIS