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Registro Completo |
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Biblioteca(s): |
Embrapa Solos. |
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Data corrente: |
22/11/2002 |
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Data da última atualização: |
03/03/2020 |
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Autoria: |
REYNOLDS JUNIOR, R. C.; WALKER, J. R. (ed.). |
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Afiliação: |
R. C. REYNOLDS JUNIOR; J. R. WALKER. |
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Título: |
Computer applications to x-ray powder diffraction analysis of clay minerals. |
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Ano de publicação: |
1993 |
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Fonte/Imprenta: |
Boulder, CO: Clay Minerals Society, 1993. |
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Páginas: |
viii, 171 p. |
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Série: |
(CMS workshop lectures, v. 5). |
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ISBN: |
1-881208-06-0 |
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Idioma: |
Inglês |
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Conteúdo: |
An introduction to computer modeling of x-ray diffraction patterns of caly minerals: a guided tour of NEWMOD; Inverting the NEWMOD x-ray diffraction forward model for clay minerals using genetic algorithms; Three-dimensional x-ray powder diffraction from disordered illite: simulation and interpretation of the diffraction patterns; Studies of clay nad clay minerals using x-ray powder diffraction and the rietveld method; Illite crystallite thickness by x-ray diffraction; A computer technique for rapid decomposition of x-ray diffraction instrumental aberrations from mineral line profiles |
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Thesagro: |
Análise; Argila; Mineral; Raio X. |
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Thesaurus Nal: |
Clay minerals; X-ray diffraction. |
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Categoria do assunto: |
P Recursos Naturais, Ciências Ambientais e da Terra |
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Marc: |
LEADER 01215nam a2200229 a 4500
001 1330055
005 2020-03-03
008 1993 bl uuuu 00u1 u #d
020 $a1-881208-06-0
100 1 $aREYNOLDS JUNIOR, R. C.
245 $aComputer applications to x-ray powder diffraction analysis of clay minerals.
260 $aBoulder, CO: Clay Minerals Society$c1993
300 $aviii, 171 p.
490 $a(CMS workshop lectures, v. 5).
520 $aAn introduction to computer modeling of x-ray diffraction patterns of caly minerals: a guided tour of NEWMOD; Inverting the NEWMOD x-ray diffraction forward model for clay minerals using genetic algorithms; Three-dimensional x-ray powder diffraction from disordered illite: simulation and interpretation of the diffraction patterns; Studies of clay nad clay minerals using x-ray powder diffraction and the rietveld method; Illite crystallite thickness by x-ray diffraction; A computer technique for rapid decomposition of x-ray diffraction instrumental aberrations from mineral line profiles
650 $aClay minerals
650 $aX-ray diffraction
650 $aAnálise
650 $aArgila
650 $aMineral
650 $aRaio X
700 1 $aWALKER, J. R.
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Registro original: |
Embrapa Solos (CNPS) |
