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Registro Completo |
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Biblioteca(s): |
Embrapa Solos. |
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Data corrente: |
22/11/2002 |
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Data da última atualização: |
22/11/2002 |
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Autoria: |
LAWES, G.; JAMES, A. M. |
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Título: |
Scanning electron microscopy and X-ray microanalysis. |
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Ano de publicação: |
1987 |
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Fonte/Imprenta: |
Chichester: John Wiley, 1987. |
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Páginas: |
103p. |
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Série: |
(Analytical Chemistry by Open Learning) |
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ISBN: |
0471-91391-X |
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Idioma: |
Inglês |
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Conteúdo: |
SEM-instrumentation ; Operating conditions and limitations ; Specimen preparation ; Speciment characteristics ; Drying techniques ; Coating ; Cryo-SEM ; SEM X-Ray microanalysis - instrumentation ; Wavelength dispersive systems (WDS); Operating conditions and limitations; Data handling; Ohter surface analytical techniques; Self assessment questions and responses; Units of measurement. |
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Palavras-Chave: |
Amostras; EDX; Energia dispersiva; Energy dispersive systems; Sistema; Varredura; X-ray microanlysis. |
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Thesagro: |
Microscopia Eletrônica; Química. |
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Thesaurus Nal: |
scanning electron microscopy. |
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Categoria do assunto: |
-- |
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Marc: |
LEADER 01119nam a2200277 a 4500
001 1330429
005 2002-11-22
008 1987 bl uuuu 00u1 u #d
020 $a0471-91391-X
100 1 $aLAWES, G.
245 $aScanning electron microscopy and X-ray microanalysis.
260 $aChichester: John Wiley$c1987
300 $a103p.
490 $a(Analytical Chemistry by Open Learning)
520 $aSEM-instrumentation ; Operating conditions and limitations ; Specimen preparation ; Speciment characteristics ; Drying techniques ; Coating ; Cryo-SEM ; SEM X-Ray microanalysis - instrumentation ; Wavelength dispersive systems (WDS); Operating conditions and limitations; Data handling; Ohter surface analytical techniques; Self assessment questions and responses; Units of measurement.
650 $ascanning electron microscopy
650 $aMicroscopia Eletrônica
650 $aQuímica
653 $aAmostras
653 $aEDX
653 $aEnergia dispersiva
653 $aEnergy dispersive systems
653 $aSistema
653 $aVarredura
653 $aX-ray microanlysis
700 1 $aJAMES, A. M.
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Embrapa Solos (CNPS) |
