Registro Completo |
Biblioteca(s): |
Ebooks. |
Data corrente: |
16/06/2011 |
Data da última atualização: |
16/06/2011 |
Autoria: |
TEHRANIPOOR, M.; AHMED, N. |
Afiliação: |
Mohammad Tehranipoor; Nisar Ahmed. |
Título: |
Nanometer Technology Designs High-Quality Delay Tests. |
Ano de publicação: |
2008 |
Fonte/Imprenta: |
Springer eBooks. |
Descrição Física: |
v.: digital |
ISBN: |
9780387757285 |
Idioma: |
Inglês |
Palavras-Chave: |
Circuits and Systems; Computer aided design; Computer engineering; Computer-Aided Engineering (CAD, CAE) and Design; Electrical Engineering; Electronics and Microelectronics, Instrumentation. |
Thesaurus Nal: |
electronics; engineering; nanotechnology; systems engineering. |
Categoria do assunto: |
-- |
URL: |
https://dx.doi.org/10.1007/978-0-387-75728-5
|
Marc: |
LEADER 00776nam a2200253 a 4500 001 1893781 005 2011-06-16 008 2008 bl uuuu u0uu1 u #d 020 $a9780387757285 100 1 $aTEHRANIPOOR, M. 245 $aNanometer Technology Designs High-Quality Delay Tests.$h[electronic resource] 260 $aSpringer eBooks.$c2008 300 $cv.: digital 650 $aelectronics 650 $aengineering 650 $ananotechnology 650 $asystems engineering 653 $aCircuits and Systems 653 $aComputer aided design 653 $aComputer engineering 653 $aComputer-Aided Engineering (CAD, CAE) and Design 653 $aElectrical Engineering 653 $aElectronics and Microelectronics, Instrumentation 700 1 $aAHMED, N.
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Ebooks (Ebooks) |