00949naa a2200181 a 450000100080000000500110000800800410001910000190006024501420007926000090022152002480023065300080047865300110048665300260049765300210052370000220054477302010056610297192006-03-22       1999    bl ---       0--  u    #d1 aPATERNO, L. G.  aMorphological characterization of conductive poly(o-ethoxyaniline) and sulfonated lignin self-assembled films by atomic force microscopy.  c1999  aIn this work, atomic force microscopy (AFM) was employed to investigate the morphology of poly(o-ethoxyaniline)/ sulfonated lignin self-assembled films. Images of films surface were obtained on each deposited layer, by AFM on the tapping mode.  aAFM  aImagem  aPoly(o-ethoxyaniline)  aUltra-thin films1 aMATTOSO, L. H. C.  tIn: INTERNATIONAL CONFERENCE ON SCANNING PROBE MICROSCOPY OF POLYMERS, 1., 1999, Santa Barbara. Abstract book and program... Santa Barbara: University of California, 1999. Não-paginado, ref. P55.