00921naa a2200229 a 450000100080000000500110000800800410001910000170006024501130007726000090019052001760019965300300037565300290040565300090043465300090044370000180045270000200047070000230049070000190051370000190053277301400055110292742006-01-20       2005    bl ---       0--  u    #d1 aLEITE, F. L.  aAtomic force spectroscopy as a tool to study thin film og conductive polymer in solution with different pHs.  c2005  aAn AFM has been used as force spectrometer to analyze repulsive and atractive forces generated in solution on polyaniline and poly(o-ethoxyaniline) films in different pHs.  aAtomic force spectroscopy  aLBL/ Layer-by-lyer films  aPANI  aPOEA1 aBORATO, C. E.1 aOLIVEIRA, O. N.1 aHERRMANN, P. S. P.1 aFROMMER, J. E.1 aMATTOSO, L. H.  tLATIN AMERICAM SYMPOSIUM ON SCANNING PROBE MICROSCOPY, 3., 2005, Ouro Preto. [Anais eletrônicos...]. Ouro Preto: SBMN, 2005. 1 CD-ROM.