01195naa a2200229 a 450000100080000000500110000800800410001910000200006024500590008026000090013952005390014865000130068765300080070065300350070865300180074365300290076165300140079070000240080470000180082870000250084677300940087110246332003-04-29       2002    bl ---       0--  u    #d1 aASSIS, O. B. G.  aAFM characterization of chitosan self-assembled films.  c2002  aAtomic force microscopy (AFM) was used to examine the surface structure of self-assbled films obtained from water-soluble chitasan rich solution precursor. The film war supported onto functionalized glass slides resulting in a mountain-and=valley structure. This feature is attributed as resulting of the experimental condition where agglomeration of molecules in solution may occur. The film height does not exceed 20nm with medium pore size of approximately 12 nm. This range of porosity is suitable for nanofiltration applications.  achitosan  aAFM  aMicroscopia de força atômica  aSelf-assmbled  aSurface characterization  aThin-film1 aBERNARDES-FILHO, R.1 aVIEIRA, D. C.1 aCAMPANA FILHO, S. P.  tInternational Journal of Polymeric Materials, Londongv. 51, n. 7, p. 633-638, Jul. 2002.