01245naa a2200193 a 450000100080000000500110000800800410001910000170006024501440007726000090022150001380023052005190036865000180088765300080090565300350091365300150094870000230096377300650098610246052010-07-22       2003    bl uuuu     u00u1 u    #d1 aLEITE, F. L.  aCaracterization of adhesion force, of two soil minerals particles (mica and siicon), in the nanoscale, using atomic force microscopy (AFM).  c2003  aCD de trabalhos e resumos apresentados no Second Latin American Symposium on Scanning Microscopy, Búzios, Apr. 2003. 2 f.  1 CD-ROM.  aThe formation of water film on surface of materials, mainly in the soil minerals, is a important feature because it is related with many physical, chemical and biological processes occurrin in soils. One of the main properties involved is the capillary phenomenon, which is related to the interaction of the van der Waals force. The investigation of this property, in the nanoscale, introduces a new concept to characterize the dynamic of the aggregate, whic is normally observed in the micrometer and macro scale.  asoil minerals  aAFM  aMicroscopia de força atômica  aWater film1 aHERRMANN, P. S. P.  tActa Microscopica, Maracaibogv.12, Apr. 2003. Supplement A.