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Registro Completo |
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Biblioteca(s): |
Embrapa Instrumentação. |
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Data corrente: |
15/03/2006 |
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Data da última atualização: |
15/03/2006 |
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Autoria: |
MATTOSO, L. H. C.; HERRMANN, P. S. P.; JOB, A. E.; GIACOMETTI, J. A. |
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Título: |
Atomic force microscopy study on polyaniline doped by corona discharge. |
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Ano de publicação: |
1999 |
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Fonte/Imprenta: |
In: INTERNATIONAL CONFERENCE ON SCANNING PROBE MICROSCOPY OF POLYMERS, 1., 1999, Santa Barbara, CA. Abstract book and program... Santa Barbara: University of California, 1999. Não paginado, ref.P13. Resumo. |
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Idioma: |
Inglês |
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Conteúdo: |
Thin films of parent polyaniline - PANI - coated onto poly (ethylene terephthalate) - PET - films were doped to the conducting state (0.1 Scm-1) by exposition to corona discharge and then analyzed by atomic force microscopy. |
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Palavras-Chave: |
AFM; PANI; PET. |
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Categoria do assunto: |
-- |
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Marc: |
LEADER 00887naa a2200193 a 4500
001 1029669
005 2006-03-15
008 1999 bl --- 0-- u #d
100 1 $aMATTOSO, L. H. C.
245 $aAtomic force microscopy study on polyaniline doped by corona discharge.
260 $c1999
520 $aThin films of parent polyaniline - PANI - coated onto poly (ethylene terephthalate) - PET - films were doped to the conducting state (0.1 Scm-1) by exposition to corona discharge and then analyzed by atomic force microscopy.
653 $aAFM
653 $aPANI
653 $aPET
700 1 $aHERRMANN, P. S. P.
700 1 $aJOB, A. E.
700 1 $aGIACOMETTI, J. A.
773 $tIn: INTERNATIONAL CONFERENCE ON SCANNING PROBE MICROSCOPY OF POLYMERS, 1., 1999, Santa Barbara, CA. Abstract book and program... Santa Barbara: University of California, 1999. Não paginado, ref.P13. Resumo.
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Registro original: |
Embrapa Instrumentação (CNPDIA) |
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Registro Completo
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Biblioteca(s): |
Embrapa Arroz e Feijão. |
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Data corrente: |
18/07/2018 |
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Data da última atualização: |
18/07/2018 |
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Tipo da produção científica: |
Artigo em Periódico Indexado |
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Circulação/Nível: |
A - 2 |
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Autoria: |
FERREIRA, L. U.; MELO, P. G. S.; VIEIRA, R. F.; LOBO JUNIOR, M.; PEREIRA, H. S.; MELO, L. C.; SOUZA, T. L. P. O. de. |
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Afiliação: |
LENIO URZEDA FERREIRA, UFG; PATRICIA GUIMARÃES SANTOS MELO, UFG; ROGERIO FARIA VIEIRA, EPAMIG; MURILLO LOBO JUNIOR, CNPAF; HELTON SANTOS PEREIRA, CNPAF; LEONARDO CUNHA MELO, CNPAF; THIAGO LIVIO PESSOA OLIV DE SOUZA, CNPAF. |
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Título: |
Combining ability as a strategy for selecting common bean parents and populations resistant to white mold. |
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Ano de publicação: |
2018 |
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Fonte/Imprenta: |
Crop Breeding and Applied Biotechnology, Viçosa, MG, v. 18, n. 3, p. 276-283, jul./set. 2018. |
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ISSN: |
1518-7853 |
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DOI: |
10.1590/1984-70332018v18n3a41 |
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Idioma: |
Inglês |
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Conteúdo: |
Common bean parents and populations resistant to white mold (WM, caused by Sclerotinia sclerotiorum) were selected based on estimates of general combining ability (GCA) and specific combining ability (SCA) for WM severity in three field nurseries in Brazil. Twenty-seven populations were obtained by partial diallel crosses between parents from two groups: GI) three sources of partial resistance identified abroad and GII) nine Brazilian cultivars and elite lines. Populations were advanced in bulk up to the F6 generation. The overall mean of WM severity from combined analysis ranged from 2.83 to 5.03 (scale of 1 to 9 scores) in the F6 population. The score of the susceptible control BRS Requinte was 7.21. The GI parents K-59, in Oratórios, MG, and Viçosa, MG, and K-407 and PI204717, in Goianira, GO, contributed to increase resistance to WM. The most promising populations for obtaining elite lines resistant to WM were K-59/BRS Executivo, PI204717/BRS Campeiro, PI204717/Jalo Precoce, K-59/BRS Radiante, and K-407/BRS Cometa. |
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Thesagro: |
Cruzamento Dialélico; Feijão; Melhoramento Genético Vegetal; Phaseolus Vulgaris; Resistência; Sclerotinia Sclerotiorum; Variedade Resistente. |
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Thesaurus NAL: |
Beans; Diallel analysis; Disease resistance; Plant breeding; Sclerotinia. |
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Categoria do assunto: |
G Melhoramento Genético |
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URL: |
https://ainfo.cnptia.embrapa.br/digital/bitstream/item/179912/1/CNPAF-2018-cbab.pdf
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Marc: |
LEADER 02152naa a2200361 a 4500
001 2093360
005 2018-07-18
008 2018 bl uuuu u00u1 u #d
022 $a1518-7853
024 7 $a10.1590/1984-70332018v18n3a41$2DOI
100 1 $aFERREIRA, L. U.
245 $aCombining ability as a strategy for selecting common bean parents and populations resistant to white mold.$h[electronic resource]
260 $c2018
520 $aCommon bean parents and populations resistant to white mold (WM, caused by Sclerotinia sclerotiorum) were selected based on estimates of general combining ability (GCA) and specific combining ability (SCA) for WM severity in three field nurseries in Brazil. Twenty-seven populations were obtained by partial diallel crosses between parents from two groups: GI) three sources of partial resistance identified abroad and GII) nine Brazilian cultivars and elite lines. Populations were advanced in bulk up to the F6 generation. The overall mean of WM severity from combined analysis ranged from 2.83 to 5.03 (scale of 1 to 9 scores) in the F6 population. The score of the susceptible control BRS Requinte was 7.21. The GI parents K-59, in Oratórios, MG, and Viçosa, MG, and K-407 and PI204717, in Goianira, GO, contributed to increase resistance to WM. The most promising populations for obtaining elite lines resistant to WM were K-59/BRS Executivo, PI204717/BRS Campeiro, PI204717/Jalo Precoce, K-59/BRS Radiante, and K-407/BRS Cometa.
650 $aBeans
650 $aDiallel analysis
650 $aDisease resistance
650 $aPlant breeding
650 $aSclerotinia
650 $aCruzamento Dialélico
650 $aFeijão
650 $aMelhoramento Genético Vegetal
650 $aPhaseolus Vulgaris
650 $aResistência
650 $aSclerotinia Sclerotiorum
650 $aVariedade Resistente
700 1 $aMELO, P. G. S.
700 1 $aVIEIRA, R. F.
700 1 $aLOBO JUNIOR, M.
700 1 $aPEREIRA, H. S.
700 1 $aMELO, L. C.
700 1 $aSOUZA, T. L. P. O. de
773 $tCrop Breeding and Applied Biotechnology, Viçosa, MG$gv. 18, n. 3, p. 276-283, jul./set. 2018.
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Registro original: |
Embrapa Arroz e Feijão (CNPAF) |
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