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Registro Completo |
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Biblioteca(s): |
Embrapa Instrumentação. |
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Data corrente: |
31/08/2005 |
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Data da última atualização: |
31/08/2005 |
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Autoria: |
ALTAFIM, R. A.; MURAKAMI, C. R.; CRUVINEL, P. E.; NAIME, J. M.; CHIERICE, G. O.; MASCARENHAS, S. |
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Título: |
Computed X-ray tomography for analyzing polymer insulators. |
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Ano de publicação: |
2001 |
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Fonte/Imprenta: |
In: CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA-CEIDP, 2001, Kitchener. CEIDP 2000: Annual report. [S. l.]: IEEE Dielectrics and Insulation Society, 2001. p. 149-152. ref. 01ch37225. |
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Idioma: |
Inglês |
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Conteúdo: |
Computed X-ray Tomography (CT) is a completely nondestructive technique for visualizing internal features of poque solid objects and for obtaining digital information on their 3-D geometries and properties. |
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Palavras-Chave: |
castor oil poliuretane resins; CT X-Ray tomography; electrical polymeric insulator. |
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Categoria do assunto: |
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Marc: |
LEADER 00975naa a2200217 a 4500
001 1029070
005 2005-08-31
008 2001 bl --- 0-- u #d
100 1 $aALTAFIM, R. A.
245 $aComputed X-ray tomography for analyzing polymer insulators.
260 $c2001
520 $aComputed X-ray Tomography (CT) is a completely nondestructive technique for visualizing internal features of poque solid objects and for obtaining digital information on their 3-D geometries and properties.
653 $acastor oil poliuretane resins
653 $aCT X-Ray tomography
653 $aelectrical polymeric insulator
700 1 $aMURAKAMI, C. R.
700 1 $aCRUVINEL, P. E.
700 1 $aNAIME, J. M.
700 1 $aCHIERICE, G. O.
700 1 $aMASCARENHAS, S.
773 $tIn: CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA-CEIDP, 2001, Kitchener. CEIDP 2000: Annual report. [S. l.]: IEEE Dielectrics and Insulation Society, 2001. p. 149-152. ref. 01ch37225.
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Registro original: |
Embrapa Instrumentação (CNPDIA) |
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