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Registro Completo |
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Biblioteca(s): |
Embrapa Soja. |
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Data corrente: |
07/04/2004 |
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Data da última atualização: |
27/07/2007 |
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Autoria: |
BROGIN, R. L.; ARIAS, C. A. A.; VELLO, N. A.; TOLEDO, J. F. F. de; PÍPOLO, A. E.; CATELLI, L. L.; MARIN, S. R. R. |
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Título: |
Molecular mapping of a gene conferring resistance to soybean rust. |
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Ano de publicação: |
2004 |
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Fonte/Imprenta: |
In: WORLD SOYBEAN RESEARCH CONFERENCE, 7.; INTERNATIONAL SOYBEAN PROCESSING AND UTILIZATION CONFERENCE, 4.; CONGRESSO BRASILEIRO DE SOJA, 3., 2004, Foz do Iguassu. Abstracts of contributed papers and posters. Londrina: Embrapa Soybean, 2004. |
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Páginas: |
p. 318. |
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Série: |
(Embrapa Soja. Documentos, 228). |
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Idioma: |
Inglês |
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Notas: |
Editado por Flávio Moscardi, Clara Beatriz Hoffmann-Campo, Odilon Ferreira Saraiva, Paulo Roberto Galerani, Francisco Carlos Krzyzanowski, Mercedes Concordia Carrão-Panizzi.
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Conteúdo: |
Soybean rust, caused by Phakopsora pachyrhizi, is a foliar disease of soybean [Glycine max (L.) Merr.] that occurs in production areas around the world and can cause severe losses to the farmers. At the moment, four genes (Rpp1 to Rpp4) that confer resistance in soybean to soybean rust have been identified in germplasm and plant introductions. This study was conducted to identify molecular markers linked to the resistance gene present in resistant soybean FT-2. A population of 116 F2:4 genetic families, from the cross of cultivar FT-2 and susceptible cultivar Davis, was evaluated under greenhouse conditions for soybean rust phenotypic reaction and identified as resistant, segregating or susceptible. DNA from the parents was screened with 230 simple sequence repeats (SSR) primer pairs. Fourteen markers showed polymorphism in the parents and were used to screen 116 F2 plants that originated the progenies evaluated to disease reaction. Putative linked markers, that cosegregated with soybean rust reaction phenotypes, amplified by the primers Satt 277, Satt 307 and Satt 460, were mapped, respectively, 22.3 cM, 12.5 cM and 41.0 cM away from the resistance gene. These markers are located on the soybean C2 linkage group (LG), that need to be better explored in order to identify molecular markers more closely related. |
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Categoria do assunto: |
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Marc: |
LEADER 02317naa a2200229 a 4500
001 1466847
005 2007-07-27
008 2004 bl uuuu u00u1 u #d
100 1 $aBROGIN, R. L.
245 $aMolecular mapping of a gene conferring resistance to soybean rust.
260 $c2004
300 $ap. 318.
490 $a(Embrapa Soja. Documentos, 228).
500 $aEditado por Flávio Moscardi, Clara Beatriz Hoffmann-Campo, Odilon Ferreira Saraiva, Paulo Roberto Galerani, Francisco Carlos Krzyzanowski, Mercedes Concordia Carrão-Panizzi.
520 $aSoybean rust, caused by Phakopsora pachyrhizi, is a foliar disease of soybean [Glycine max (L.) Merr.] that occurs in production areas around the world and can cause severe losses to the farmers. At the moment, four genes (Rpp1 to Rpp4) that confer resistance in soybean to soybean rust have been identified in germplasm and plant introductions. This study was conducted to identify molecular markers linked to the resistance gene present in resistant soybean FT-2. A population of 116 F2:4 genetic families, from the cross of cultivar FT-2 and susceptible cultivar Davis, was evaluated under greenhouse conditions for soybean rust phenotypic reaction and identified as resistant, segregating or susceptible. DNA from the parents was screened with 230 simple sequence repeats (SSR) primer pairs. Fourteen markers showed polymorphism in the parents and were used to screen 116 F2 plants that originated the progenies evaluated to disease reaction. Putative linked markers, that cosegregated with soybean rust reaction phenotypes, amplified by the primers Satt 277, Satt 307 and Satt 460, were mapped, respectively, 22.3 cM, 12.5 cM and 41.0 cM away from the resistance gene. These markers are located on the soybean C2 linkage group (LG), that need to be better explored in order to identify molecular markers more closely related.
700 1 $aARIAS, C. A. A.
700 1 $aVELLO, N. A.
700 1 $aTOLEDO, J. F. F. de
700 1 $aPÍPOLO, A. E.
700 1 $aCATELLI, L. L.
700 1 $aMARIN, S. R. R.
773 $tIn: WORLD SOYBEAN RESEARCH CONFERENCE, 7.; INTERNATIONAL SOYBEAN PROCESSING AND UTILIZATION CONFERENCE, 4.; CONGRESSO BRASILEIRO DE SOJA, 3., 2004, Foz do Iguassu. Abstracts of contributed papers and posters. Londrina: Embrapa Soybean, 2004.
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Registro original: |
Embrapa Soja (CNPSO) |
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 | Acesso ao texto completo restrito à biblioteca da Embrapa Instrumentação. Para informações adicionais entre em contato com cnpdia.biblioteca@embrapa.br. |
Registro Completo
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Biblioteca(s): |
Embrapa Instrumentação. |
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Data corrente: |
22/11/2018 |
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Data da última atualização: |
23/11/2018 |
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Tipo da produção científica: |
Resumo em Anais de Congresso |
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Autoria: |
TERRA, I. A. A.; SANFELICE, R. C.; SCAGION, V. P.; CORREA, D. S. |
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Afiliação: |
DANIEL SOUZA CORREA, CNPDIA. |
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Título: |
Investigation of physico-chemical, morphological and spectroscopic properties of PVP/Eu3+ electrospun nanofibers. |
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Ano de publicação: |
2018 |
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Fonte/Imprenta: |
In: BRAZIL MRS MEETING - SBPMAT, 17, 2018, Natal, RN. Proceedings... Natal, RN: SBPMat, 2018. |
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Idioma: |
Inglês |
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Palavras-Chave: |
Morphological properties; Physico-chemical properties; Propriedades espectroscópicas de nanofibras; Propriedades físico-químicas; Propriedades morfológicas; Spectroscopic properties electrospun nanofibers. |
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Categoria do assunto: |
-- |
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Marc: |
LEADER 00810nam a2200205 a 4500
001 2099854
005 2018-11-23
008 2018 bl uuuu u00u1 u #d
100 1 $aTERRA, I. A. A.
245 $aInvestigation of physico-chemical, morphological and spectroscopic properties of PVP/Eu3+ electrospun nanofibers.$h[electronic resource]
260 $aIn: BRAZIL MRS MEETING - SBPMAT, 17, 2018, Natal, RN. Proceedings... Natal, RN: SBPMat$c2018
653 $aMorphological properties
653 $aPhysico-chemical properties
653 $aPropriedades espectroscópicas de nanofibras
653 $aPropriedades físico-químicas
653 $aPropriedades morfológicas
653 $aSpectroscopic properties electrospun nanofibers
700 1 $aSANFELICE, R. C.
700 1 $aSCAGION, V. P.
700 1 $aCORREA, D. S.
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