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Registro Completo |
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Biblioteca(s): |
Ebooks. |
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Data corrente: |
07/01/2011 |
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Data da última atualização: |
02/03/2011 |
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Autoria: |
WANG, L.-T.; STROUD, C. E.; TOUBA, N. A. |
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Afiliação: |
Charles E. Stroud; Nur A. Touba. |
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Título: |
System-on-chip test architectures: nanometer design for testability |
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Ano de publicação: |
2008 |
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Fonte/Imprenta: |
Amsterdam; Boston: Morgan Kaufmann Publishers, c2008. |
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Páginas: |
xxxvi, 856 p. : |
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Descrição Física: |
ill. ;25 cm. |
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Série: |
The Morgan Kaufmann series in systems on silicon |
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ISBN: |
9780123739735 |
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Idioma: |
Inglês |
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Conteúdo: |
Introduction; Digital Test Architectures; Fault-Tolerant Design; SOC/NOC Test Architectures; SIP Test Architectures; Delay Testing; Low-Power Testing; Coping with Physical Failures, Soft Errors, and Reliability Issues; Design for Manufacturability and Yield; Design for Debug and Diagnosis; Software-Based Self-Testing; FPGA Testing; MEMS Testing; High-Speed I/O Interface; Analog and Mixed-Signal Test Architectures; RF Testing; Testing Aspects of Nanotechnology Trends.Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today?s overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. KEY FEATURES * Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. * Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. * Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. * Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. * Practical problems at the end of each chapter for students. MenosIntroduction; Digital Test Architectures; Fault-Tolerant Design; SOC/NOC Test Architectures; SIP Test Architectures; Delay Testing; Low-Power Testing; Coping with Physical Failures, Soft Errors, and Reliability Issues; Design for Manufacturability and Yield; Design for Debug and Diagnosis; Software-Based Self-Testing; FPGA Testing; MEMS Testing; High-Speed I/O Interface; Analog and Mixed-Signal Test Architectures; RF Testing; Testing Aspects of Nanotechnology Trends.Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today?s overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. KEY FEATURES * Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. * Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, ME... Mostrar Tudo |
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Palavras-Chave: |
Integrated circuits; Systems on a chip. |
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Categoria do assunto: |
-- |
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URL: |
https://www.sciencedirect.com/science/book/9780123739735
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Marc: |
LEADER 02704nam a2200193 a 4500
001 1872201
005 2011-03-02
008 2008 bl uuuu u0uu1 u #d
020 $a9780123739735
100 1 $aWANG, L.-T.
245 $aSystem-on-chip test architectures$bnanometer design for testability$h[electronic resource]
260 $aAmsterdam; Boston: Morgan Kaufmann Publishers$c2008
300 $axxxvi, 856 p. :$cill. ;25 cm.
490 $aThe Morgan Kaufmann series in systems on silicon
520 $aIntroduction; Digital Test Architectures; Fault-Tolerant Design; SOC/NOC Test Architectures; SIP Test Architectures; Delay Testing; Low-Power Testing; Coping with Physical Failures, Soft Errors, and Reliability Issues; Design for Manufacturability and Yield; Design for Debug and Diagnosis; Software-Based Self-Testing; FPGA Testing; MEMS Testing; High-Speed I/O Interface; Analog and Mixed-Signal Test Architectures; RF Testing; Testing Aspects of Nanotechnology Trends.Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today?s overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. KEY FEATURES * Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. * Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. * Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. * Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. * Practical problems at the end of each chapter for students.
653 $aIntegrated circuits
653 $aSystems on a chip
700 1 $aSTROUD, C. E.
700 1 $aTOUBA, N. A.
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| 1. |  | CHOUGULE, K, M.; OLSON, A.; MAGALHAES, J. V. de; VAN BUREN, P.; WANG, L.; WARE, D. Assessing new tools and best practices for RNA seq data analysis and visualization with iPlant cyberinfrastructure. In: MEETING ON GENOMIC INFORMATICS, 2015, New York. Abstracts of papers. New York: Cold Spring Harbor Laboratory, 2015. p. 64.| Tipo: Resumo em Anais de Congresso |
| Biblioteca(s): Embrapa Milho e Sorgo. |
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| 2. | | LOPES, F. R.; JJINGO, D.; SILVA C. R. M. da; ANDRADE, A. C.; MARRACCINI, P.; TEIXEIRA, J. B.; CARAZZOLLE, M. F.; PEREIRA, G. A. G.; PEREIRA, L. F. P.; VANZELA, A. L. L.; WANG, L.; JORDAN, I. K.; CARARETO, C. M. A. Transcriptional activity, chromosomal distribution and expression effects of transposable elements in Coffea genomes. Plos One, v, 8, n. 11, e78931, 2013.| Tipo: Artigo em Periódico Indexado | Circulação/Nível: A - 1 |
| Biblioteca(s): Embrapa Recursos Genéticos e Biotecnologia. |
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| 3. | | KRASILNIKOV, P.; FONTANA, A.; LANDI, A.; MERMUT, A. R.; LABAZ, B.; SMRECZAK, B.; PINHEIRO, C. R.; VAN HUYSSTEEN, C. W.; MONGER, C.; OLIVEIRA, F. P. de; MORRAS, H. J. M.; HUSEIN, H. H.; IVELIC-SÁEZ, J.; PERALTA, K.; WANG, L.; ANJOS, L. H. C. dos; SANTOS, L. A. C. dos; PFEIFFER, M.; PEREIRA, M. G.; BOLANOS-BENAVIDES, M. M.; TABOADA, M. A.; CAMPOS, M. C. C.; DALMOLIN, R. S. D.; OROZAKUNOVA, R.; USTINOV, S.; RADIC, S.; VALLE, S.; KUYPER, T. W.; CHERLINKA, V.; DEMETRIO, W.; CARDONA, W. A.; ZHANG, Y.; DMYTRUK, Y.; TAKATA, Y. Status and challenges of black soils. In: FAO. Global status of black soils. Rome, 2022. cap. 3, p. 71-105.| Tipo: Capítulo em Livro Técnico-Científico |
| Biblioteca(s): Embrapa Solos. |
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| 4. | | ANGELINI, M. E.; FONTANA, A.; LANDI, A.; MERMUT, A. R.; MOREIRA, A. L.; LOPATKA, A.; LABAZ, B.; IRINA, B.; VANDENBYGAART, B.; OLGA, B.; PÁLKA, B.; SMRECZAK, B.; CLERICI, C.; PINHEIRO JÚNIOR, C. R.; FERGUSON, C.; OLGA, C.; VAN HUYSSTEEN, C. W.; MONGER, C.; WEI, D.; RODRÍGUEZ, D. M.; LINDBO, D.; NURSYAMSI, D.; CAHYANA, D.; BEAUDETTE, D.; NUREMBERG, E.; LIU, F.; FONTES, F.; OLIVEIRA, F. P. de; ZHANG, G.; OLEG, G.; PEREIRA, G.; SCHULZ, G.; VASQUES, G. M.; IAAICH, H.; MORRÁS, H. J. M.; HUSEIN, H. H.; GUTIÉRREZ DÍAZ, J. S.; IVELIC-SÁEZ, J.; KOBZA, J.; FUENTE, J. C. de la; HE, J.; NIKOLAI, K.; RODRÍGUEZ JIMÉNEZ, L. M.; WANG, L.; TENTI VUEGEN, L.; JIN, L.; MORETTI, L. M.; ANJOS, L. H. C. dos; SANTOS, L. A. C. dos; PFEIFFER, M.; PEREIRA, M. G.; GUEVARA SANTAMARIA, M.; BOLAÑOS-BENAVIDES, M.; DELL'ACQUA, M.; SAKSA, M.; COELHO, M. R.; CAMPOS, M. C. C.; NEVENA, M.; ORDOÑEZ DELGADO, N.; BATKHISHIG, O.; SERRATO ALCAREZ, P. K.; MOUSSSADEK, R.; DART, R. de O.; DALMOLIN, R. S. D.; OROZAKUNOVA, R.; RADIC, S.; TOMA, S.; WILLS, S. A.; ROECKER, S.; VALLE, S.; KIENAST-BROWN, S.; NAKISKO, S.; KUYPER, T. W.; SOLOVEI, V.; IVAN, V.; CHERLINKA, V.; MORA, V. R. de la; LEBED, V.; CARDONA, W. A.; GENG, X.; LI, Y.; ZHANG, Y.; SULAEMAN, Y.; ZALAVSKYI, Y.; YIGINI, Y.; TAKATA, Y.; SUN, Z. Global distribution and characteristics of black soils. In: FAO. Global status of black soils. Rome, 2022. cap. 2, p. 14-69.| Tipo: Capítulo em Livro Técnico-Científico |
| Biblioteca(s): Embrapa Solos. |
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| 5. | | MAES, P.; AMARASINGHE, G. K.; AYLLÓN, M. A.; BASLER, C. F.; SINA, B.; BLASDELL, K. R.; BRIESE, T.; BROWN, P. A.; BUKREYEV, A.; BALKEMA-BUSCHMANN, A.; BUCHHOLZ, U. J.; CHANDRAN, K.; CROZIER, I.; SWART, R. de; DIETZGEN, R. G.; DOLNIK, O.; DOMIER, L. L.; DREXLER, J. F.; DÜRRWALD, R.; DUNDON, W. G.; DUPREX, W. P.; DYE, J. M.; EASTON, A. J.; FOOKS, A. R.; FORMENTY, P. B. H.; FOUCHIER, R. A. M.; ASTUA, J. de F.; GHEDIN, E.; GRIFFITHS, A.; HEWSON, R.; HORIE, M.; HURWITZ, J. L.; HYNDMAN, T. H.; JIANG, D.; KOBINGER, G. P.; KONDO, H.; KURATH, G.; KUZMIN, I. V.; LAMB, R. T A.; LEE, B.; LEROY, E. M.; LI, J.; MARZANO, S. L.; MUHLBERGER, E.; NETESOV, S.; NETESOV, S. V.; PALACIOS, G.; PÁLYI, B.; PAWESKA, J. T.; PAYNE, S. L.; RIMA, B. K.; ROTA, P.; RUBBENSTROTH, D.; SIMMONDS, P.; SMITHER, S. J.; SONG, Q.; SONG, T.; SPANN, K.; STENGLEIN, M. D.; STONE, D. M.; TAKADA, A.; TESH, R. T B.; TOMONAGA, K.; TORDO, N.; TOWNER, J. S.; VAN DEN HOOGEN, B.; VASILAKIS, N.; WAHL, V.; WALKER, P. J.; WANG, D.; WANG, L.-F.; WHITFIELD, A. E.; WILLIAMS, J. V.; YE, G.; ZERBINI, F. M.; ZHANG, Y.-Z.; KUHN, J. H. Taxonomy of the order Mononegavirales: second update 2018. Archives of Virology, p.1-12, 2019.| Tipo: Artigo em Periódico Indexado | Circulação/Nível: A - 2 |
| Biblioteca(s): Embrapa Mandioca e Fruticultura. |
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| 6. | | AMARASINGHE, G. K.; AYLLÓN, M. A.; BÀO, Y.; BASLER, C. F.; BAVARI, S.; BLASDELL, K. R.; BRIESE, T.; BROWN, P. A.; BUKREYEV, A.; BUSCHMANN, A. B.; BUCHHOLZ, U. J.; JESUS, C. C.; CHANDRAN, K.; CHIAPPONI, C.; CROZIER, I.; SWART, R. L. de; DIETZGEN, R. G.; DOLNIK, O.; DREXLER, J. F.; DÜRRWALD, R.; DUNDON, W. G.; DUPREX, W. P.; DYE, J. M.; EASTON, A. J.; FOOKS, A. R.; FORMENTY, P. B. H; FOUCHIER, R. A. M; ASTUA, J. de F.; GRIFFITHS, A.; HEWSON, R.; HORIE, M.; HYNDMAN, T. H.; JIÃNG, D.; KITAJIMA, E. W.; KOBINGER. G. P.; KONDÕ, H.; KURATH, G.; KUZMIN, I. V.; LAMB, R. A.; LAVAZZA, A.; LEE, B.; LELLI, D.; LEROY, E. M.; LI, J.; MAES, P.; MARZANO, S. L.; MORENO, A.; MÜHLBERGER, E.; NETESOV, S. V.; NOWOTNY, N.; NYLUND, A.; ØKLAND, A. L.; PALACIOS, G.; Pályi, B.; PAW?SKA, J. T.; PAYNE, S. L.; PROSPERI, A.; GONZALEZ, P. L. R.; RIMA, B. K.; ROTA, P.; RUBBENSTROTH, D.; SH?, M.; SIMMONDS, P.; SMITHER, S. J.; SOZZI, E.; SPANN, K.; STENGLEIN, M. D.; STONE, D. M.; TAKADA, A.; TESH, R. B.; TOMONAGA, K.; TORDO, N.; TOWNER, J. S.; HOOGEN, B. V. D.; VASILAKIS, N.; WAHL, V.; WALKER, P. J.; WANG, L.; WHITFIELD, A. E.; WILLIAMS, J. V.; ZERBINI, F. M.; ZH?NG, T.; ZHANG, Y. Z.; KUHN, J. H. Taxonomy of the order Mononegavirales: update 2019. Archives of Virology, v.164, p.1967-1980, 2019.| Tipo: Artigo em Periódico Indexado | Circulação/Nível: A - 2 |
| Biblioteca(s): Embrapa Mandioca e Fruticultura. |
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| 7. | | KUHN, J.; ADKINS, S.; AGWANDA, B. R.; KUBRUSLI, R. A.; ALKHOVSKY, S. V.; AMARASINGHE, G. K.; TATJANA, A.-Z.; AYLLÓN, M. A.; BAHL, J.; BALKEMA BUSCHMANN, A.; BALLINGER, M. J.; BASLER, C. F.; BAVARI, S.; BEER, M.; BEJERMAN, N.; BENNETT, A. J.; DBENTE, D. A.; BERGERON, É.; BIRD, B. H.; BLAIR, C. D.; BLASDELL, K. R.; BLYSTAD, D. R.; BOJKO, J.; BORTH, W. B.; BRADFUTE, S.; BREYTA, R.; BRIESE, T.; BROWN, P. A.; BROWN, J. K.; BUCHHOLZ, U. J.; BUCHMEIER, M. J.; ABUKREYEV, A.; BURT, F.; BÜTTNER, C.; CALISHER, C. H.; CAO, M.; CASAS, I.; CHANDRAN, K.; CHARREL, R. N.; CHENG, Q.; CHIAKI, Y.; CHIAPELLO, M.; CHOI, I. R.; CIUFO, M.; CLEGG, J. C. S.; CROZIER, I.; BÓ, E. D.; DE LA TORRE, J. C.; LAMBALLERIE, X. de; SWART, R. L. de; DEBAT, H.; DHEILLY, N. M.; DI CICCO, E.; DI PAOLA, N.; DI SERIO, F.; DIETZGEN, R. G.; DIGIARO, M.; DOLNIK, O.; DREBOT, M. A.; DREXLER, J. F.; DUNDON, W. G.; DUPREX, W. P.; DÜRRWALD, R.; DYE, J. M.; EASTON, A. J.; EBIHARA, H.; ELBEAINO, T.; ERGÜNAY, K.; FERGUSON, H. W.; FOOKS, A. R.; FORGIA, M.; FORMENTY, P. B. H.; FRÁNOVÁ, J.; ASTUA, J. de F.; FU, J.; FÜRL, S.; ZACHERT, S. G.; GĀO, G. F.; GARCÍA, M. L.; SASTRE, A. G.; GARRISON, A. R.; GASKIN, T.; GONZALE, J. P. J.; GRIFTHS, A.; GOLDBERG, T. L.; GROSCHUP, M. H.; GÜNTHER, S.; HALL, R. A.; HAMMOND, J.; HAN, O.; HEPOJOKI, J.; HEWSON, R.; HONG, J.; HONG, N.; HORIE, M.; HU, J. S.; HU, T.; HUGHES, H. R.; HÜTTNER, F.; HYNDMAN, T. H.; ILYAS, M.; JALKANEN, R.; JIĀNG, D.; JONSON, G. J.; JUNGLEN, S.; KADONO, F.; KAUKINEN, K. H.; KAWATE, M.; KLEMPA, B.; KLINGSTRÖM, J.; KOBINGER, G.; KOLONIUK, I.; KONDŌ, H.; KOONIN, V.; KRUPOVIC, M.; KUBOTA, K.; KURATH, G.; LAENEN, L.; LAMBERT, A. J.; LANGEVIN, S. L.; LEE, B.; LEFKOWITZ, E. J.; LI, L.; LEROY, E. M.; LI, S.; LÍ, J.; LIU, H.; LUKASHEVICH, I. S.; MAES, P.; SOUZA, W. M. de; MARKLEWITZ, M.; MARSHALL, S. H.; MARZANO, S. L.; MASSART, S.; MCCAULEY, J. W.; MELZER, M.; MILLER, K. M.; MING, T. J.; MIRAZIMI, A.; MORDECAI, G. J.; MÜHLBACH, H. P.; MÜHLBERGER, E.; NAIDU, R.; NATSUAKI, T.; NAVARRO, J. A.; NETESOV, S. Y V.; NEUMANN, G.; NOWOTNY, N.; NUNES, M. R. T.; VELARDE, A. O.; PALACIOS, G.; PALLÁS, V.; PÁLYI, B.; PAPA, A.; PARASKEVOPOULOU, S.; PARK, A. C.; PARRISH, C. R.; PATTERSON, D. A.; CORRÊA, A. P.; PAWESKA, J. T.; PAYNE, S.; PERACCHIO, C.; PÉREZ, D. R.; POSTLER, T. S.; QI, L.; RADOSHITZKY, S. R.; RESENDE, R. O.; REYES, C. A.; RIMA, B. K.; LUNA, G. R.; ROMANOWSKI, V.; ROTA, P.; RUBBENSTROTH, D.; RUBINO, L.; RUNSTADLER, J. A.; SABANADZOVIC, S.; SALL, A. A.; SALVATO, M. S.; SANG, R.; SASAYA, T.; SCHULZE, A. D.; SCHWEMMLE, M.; SHI, M.; SHÍ, X.; SHIMOMOTO, Y.; SHIRAKO, Y.; SIDDELL, S. G.; SIMMONDS, P.; SIRONI, M.; SMAGGHE, G.; SMITHER, S.; SONG, J. W.; SPANN, K.; SPENGLER, J. R.; STENGLEIN, M. D.; STONE, D. M.; SUGANO, J.; TABATA, A.; TAKADA, A.; TAKEUCHI, S.; TCHOUASSI, D. P.; TEFER, A.; TESH, R. B.; THORNBURG, N. J.; TOMITAKA, Y.; TOMONAGA, K.; TORDO, N.; TORTO, B.; TOWNER, J. S.; TSUDA, S.; TU, C.; TURINA, M.; TZANETAKIS, I. E.; UCHIDA, J.; USUGI, T.; VAIRA, A. M.; VALLINO, M.; VAN DEN HOOGEN, B.; VARSANI, A.; VASILAKIS, N.; VERBEEK, M.; BARGEN, S. V.; WADA, J.; WAHL, V.; WALKER, P. J.; WANG, L. F.; WANG, G.; WANG, Y.; WANG, Y.; WAQAS, M.; WÈI, T.; WEN, S.; WHITFELD, A. E.; WILLIAMS, J. V.; WOLF, Y. I.; WU, J.; XU, L.; YANAGISAWA, H.; YANG, C.; YANG, Z.; ZERBINI, F. M.; ZHAI, L.; ZHANG, Y. Z.; ZHANG, O.; ZHANG, J.; ZHANG, Z.; ZHOU, X. 2021 Taxonomic update of phylum Negarnaviricota (Riboviria: Orthornavirae), including the large orders Bunyavirales and Mononegavirale. Archives of Virology, August, 2021.| Tipo: Artigo em Periódico Indexado | Circulação/Nível: A - 2 |
| Biblioteca(s): Embrapa Mandioca e Fruticultura. |
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| Registros recuperados : 7 | |
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