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Registro Completo |
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Biblioteca(s): |
Embrapa Instrumentação. |
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Data corrente: |
29/03/2006 |
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Data da última atualização: |
29/03/2006 |
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Autoria: |
ASSIS, O. B. G.; BERNARDES-FILHO, R.; PESSOA, J. D. C. |
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Título: |
The surface roughness assessment: a comparison between AFM and SEM profile lines. |
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Ano de publicação: |
1998 |
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Fonte/Imprenta: |
In: INTERNATIONAL CONGRESS ON ELECTRON MICROSCOPY=MEMORIAS DEL CONGRESO INTERNACIONAL DE MICROSCOPÍA ELETRÓNICA-ICEM, 14., 1998, Cancún. Electron microscopy 1998: paper presented... Bristol: Institute of Physics Publshing, 1998. v.3, p. 703-704. Edited by: Héctor A. Calderón Benavides, Miguel José Yacamán. |
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Idioma: |
Inglês |
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Conteúdo: |
The ability to visualize and quantify surface roughness is fundamental in understanding how to process materials with improved performance since surface conditions govern a great range of engineering materials properties. For such assessment, the most widely used measuring instrument isthe mechanical profilometer. |
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Palavras-Chave: |
AFM; Atomic Force Microscope; Scanning Electron Microscope; Scanning Probe Microscope; SEM; SPM. |
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Categoria do assunto: |
-- |
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Marc: |
LEADER 01193naa a2200217 a 4500
001 1027003
005 2006-03-29
008 1998 bl --- 0-- u #d
100 1 $aASSIS, O. B. G.
245 $aThe surface roughness assessment$ba comparison between AFM and SEM profile lines.
260 $c1998
520 $aThe ability to visualize and quantify surface roughness is fundamental in understanding how to process materials with improved performance since surface conditions govern a great range of engineering materials properties. For such assessment, the most widely used measuring instrument isthe mechanical profilometer.
653 $aAFM
653 $aAtomic Force Microscope
653 $aScanning Electron Microscope
653 $aScanning Probe Microscope
653 $aSEM
653 $aSPM
700 1 $aBERNARDES-FILHO, R.
700 1 $aPESSOA, J. D. C.
773 $tIn: INTERNATIONAL CONGRESS ON ELECTRON MICROSCOPY=MEMORIAS DEL CONGRESO INTERNACIONAL DE MICROSCOPÍA ELETRÓNICA-ICEM, 14., 1998, Cancún. Electron microscopy 1998: paper presented... Bristol: Institute of Physics Publshing, 1998.$gv.3, p. 703-704. Edited by: Héctor A. Calderón Benavides, Miguel José Yacamán.
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Registro original: |
Embrapa Instrumentação (CNPDIA) |
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