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Registro Completo |
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Biblioteca(s): |
Embrapa Acre. |
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Data corrente: |
13/06/2000 |
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Data da última atualização: |
21/02/2024 |
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Autoria: |
BEDDOW, J. K. (ed.). |
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Afiliação: |
JOHN KEITH BEDDOW. |
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Título: |
Particle characterization in technology: applications and microanalysis. |
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Ano de publicação: |
1984 |
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Fonte/Imprenta: |
Boca Raton: CRC Press, 1984. |
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Volume: |
v. 2, |
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Páginas: |
265 p. |
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Série: |
(CRC Series on fine particle science and technology). |
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ISBN: |
o-8493-5785-3 |
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Idioma: |
Inglês |
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Conteúdo: |
Theory of morphologycal analysis. Particle shape characterization from packing density. A research mode of a particle image analyzing systemFast fourier transform. FORTH: its potencial as the computer language for shape analysis. Color as a morphic feature. Fourier shape analysis- a multi variate pattern recognition approach. Smoothing a digitized particle profile. Shape prediction using prototypes and membership interpolation. Morphologycal analysis of unknown samples. Optimal definition of class intervals of histograms or frequency plots. Recent applications of morphological analysis. Particle morphology and abrasive wear. Relationships Between particle morphology and production processes. |
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Palavras-Chave: |
Bulk solids; Characterization methods; Interpolation; Ion mass spectroscopy; Kinetic modeling; Liquid suspension; Shape prediction; Surface analyses. |
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Categoria do assunto: |
-- |
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Marc: |
LEADER 01408nam a2200241 a 4500
001 1493822
005 2024-02-21
008 1984 bl uuuu 00u1 u #d
020 $ao-8493-5785-3
100 1 $aBEDDOW, J. K.
245 $aParticle characterization in technology$bapplications and microanalysis.
260 $aBoca Raton: CRC Press$c1984
300 $a265 p. v. 2,
490 $a(CRC Series on fine particle science and technology).$vv. 2,
520 $aTheory of morphologycal analysis. Particle shape characterization from packing density. A research mode of a particle image analyzing systemFast fourier transform. FORTH: its potencial as the computer language for shape analysis. Color as a morphic feature. Fourier shape analysis- a multi variate pattern recognition approach. Smoothing a digitized particle profile. Shape prediction using prototypes and membership interpolation. Morphologycal analysis of unknown samples. Optimal definition of class intervals of histograms or frequency plots. Recent applications of morphological analysis. Particle morphology and abrasive wear. Relationships Between particle morphology and production processes.
653 $aBulk solids
653 $aCharacterization methods
653 $aInterpolation
653 $aIon mass spectroscopy
653 $aKinetic modeling
653 $aLiquid suspension
653 $aShape prediction
653 $aSurface analyses
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Registro original: |
Embrapa Acre (CPAF-AC) |
