Registro Completo |
Biblioteca(s): |
Embrapa Instrumentação. |
Data corrente: |
30/03/2006 |
Data da última atualização: |
30/03/2006 |
Autoria: |
ALVES, C. R.; ASSIS, O. B. G. |
Título: |
EDX and AFM topography analysis of sol-gel SiO2 films on ceramic substrate. |
Ano de publicação: |
2000 |
Fonte/Imprenta: |
In: ANNUAL MEETING & EXPOSITION, 102., 2000, St. Louis. Annual meeting abstracts: gateway to the new milennium: abstract book... Westerville: American Ceramic Society, 2000. p.164. |
Idioma: |
Inglês |
Conteúdo: |
Dip-coating sol-gel technique was used for SiO2 film formation onto a ceramic substrate. The main aim is to form a controlled porous thin film appropriate for enzymes coupling and sensor applications. The experimental procedure followed the conventional sol-gel process form a perecursor solution of TMOS. |
Palavras-Chave: |
Cerâmica; Dip-coating; Sol-gel; TMOS. |
Thesaurus Nal: |
atomic force microscopy. |
Categoria do assunto: |
-- |
Marc: |
LEADER 00954naa a2200193 a 4500 001 1029770 005 2006-03-30 008 2000 bl --- 0-- u #d 100 1 $aALVES, C. R. 245 $aEDX and AFM topography analysis of sol-gel SiO2 films on ceramic substrate. 260 $c2000 520 $aDip-coating sol-gel technique was used for SiO2 film formation onto a ceramic substrate. The main aim is to form a controlled porous thin film appropriate for enzymes coupling and sensor applications. The experimental procedure followed the conventional sol-gel process form a perecursor solution of TMOS. 650 $aatomic force microscopy 653 $aCerâmica 653 $aDip-coating 653 $aSol-gel 653 $aTMOS 700 1 $aASSIS, O. B. G. 773 $tIn: ANNUAL MEETING & EXPOSITION, 102., 2000, St. Louis. Annual meeting abstracts: gateway to the new milennium: abstract book... Westerville: American Ceramic Society, 2000. p.164.
Download
Esconder MarcMostrar Marc Completo |
Registro original: |
Embrapa Instrumentação (CNPDIA) |